aes auger electron spectroscopy

基本解释

Microstructures of thin films are characterized by X-ray Diffraction (XRD) and auger Electron spectroscopy (AES).
通过X射线衍射（XRD）和俄歇电子能谱（AES）分析研究了薄膜的微结构；
Auger electron spectroscopy(AES) and X ray photoelectron spectroscopy(XPS) are employed to study the synergistic mechanism.
采用俄歇电子能谱（AES）和X射线光电子能谱（XPS）研究其协合润滑机理。
The surface defects of silver coins was analysed with auger electron spectroscopy (AES), Scanning electronic microscope (SEM) and energy dispersive spectrum (EDS).
采用扫描电镜、能量色散谱和俄歇电子能谱检测方法，对银币表面缺陷进行了分析。